A study of the initial film growth of PEG-like plasma polymer films via XPS and NEXAFS

被引:20
|
作者
Li, Yali [1 ,2 ]
Muir, Benjamin W. [1 ]
Easton, Christopher D. [1 ]
Thomsen, Lars [3 ]
Nisbet, David R. [4 ]
Forsythe, John S. [2 ]
机构
[1] CSIRO Mat Sci & Engn, Clayton, Vic 3169, Australia
[2] Monash Univ, Dept Mat Engn, Clayton, Vic 3800, Australia
[3] Australian Synchrotron, Clayton, Vic 3168, Australia
[4] Australian Natl Univ, Coll Engn & Comp Sci, Res Sch Engn, Acton, ACT 0200, Australia
关键词
Plasma polymer films; Substrate-film interface; PEG-like; Chemical composition; NEXAFS; X-RAY; CHEMICAL-ANALYSIS; NEUTRON REFLECTOMETRY; MOLECULAR-STRUCTURE; ETHYLENE-GLYCOL; FINE-STRUCTURE; ION ENERGY; DEPOSITION; MECHANISMS; CHEMISTRY;
D O I
10.1016/j.apsusc.2013.10.022
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The chemistry of substrate-film interface (underside) of di(ethylene glycol) dimethyl ether plasma polymer (DGpp) films has been studied directly and compared to the top layer of the film (topside). By depositing the plasma polymer films onto indium tin oxide (ITO) glass, the films were easily delaminated from the substrate. The top- and underside of the films were examined by X-ray photoelectron spectroscopy (XPS) and near edge X-ray absorption fine structure (NEXAFS) spectroscopy. It was found that a rapid increase in pressure during plasma polymerization results in steep chemical gradients in the films, while small pressure changes do not lead to chemical gradient formation. These observations validate the findings of previous neutron reflectometry modeling studies of this class of plasma polymer thin film. In addition, subtle variations in plasma polymer film chemistry were observed between different substrates they were deposited onto. This approach will allow additional studies on the mechanisms of early plasma polymer thin film formation with various monomers. (C) 2013 Published by Elsevier B.V.
引用
收藏
页码:288 / 294
页数:7
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