Structure of iron silicide film on Si(111) grown by solid-phase epitaxy and reactive deposition epitaxy

被引:10
|
作者
Matsumoto, M [1 ]
Sugie, K [1 ]
Kawauchi, T [1 ]
Fukutani, K [1 ]
Okano, T [1 ]
机构
[1] Univ Tokyo, Inst Ind Sci, Meguro Ku, Tokyo 1538505, Japan
关键词
iron silicide; film growth; scanning tunneling microscopy (STM); low-energy electron diffraction (LEED);
D O I
10.1143/JJAP.45.2390
中图分类号
O59 [应用物理学];
学科分类号
摘要
The method dependence of iron silicide grown on Si(I 11) was studied by scanning tunneling microscopy. The iron silicide films grown by two different methods (solid-phase epitaxy and reactive deposition epitaxy) were compared at a small-film-thickness region below I nm. The Surface morphology strongly depends on the growth method, which suggests that the strain in the interface region is affected by the growth method.
引用
收藏
页码:2390 / 2394
页数:5
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