Fourier transform coherent anti-Stokes Raman scattering (FTCARS) microscopy

被引:0
|
作者
Cui, Meng [1 ]
Skodack, Joshua [1 ]
Ogilvie, Jennifer P. [1 ]
机构
[1] Univ Michigan, Dept Phys, Ann Arbor, MI 49109 USA
关键词
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暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We demonstrate FTCARS microscopy and show that an external field combined with the signal can overcome detector dark noise. We discuss conditions for obtaining shot-noise-limited detection and compare the S/N of FTCARS with other methods. (C)2008 Optical Society of America
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页码:1003 / 1004
页数:2
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