Accounting for quantum effects and polysilicon depletion in an analytical design-oriented MOSFET model

被引:0
|
作者
Bucher, M [1 ]
Sallese, JM [1 ]
Lallement, C [1 ]
机构
[1] Natl Tech Univ Athens, Athens, Greece
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An analytical MOSFET model is presented that accounts for energy quantization in inversion charge and depletion in the poly gate. The model consistently describes effects on charges, transcapacitances, drain current and transconductances in all regions of operation, depending on five physical device parameters and bias conditions. Comparison to experimental data is provided and parameter extraction briefly discussed. The model offers manageable equations providing insight into the physical phenomena, thereby supporting analog circuit design practice as well as efficient circuit simulation.
引用
收藏
页码:296 / 299
页数:4
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