Microprocessor multi-channel strain-gauge systems for dynamic tests of structures

被引：3

作者：

Stepanova, L. N. ^{[1
]}

Kabanov, S. I. ^{[1
]}

Bekher, S. A. ^{[2
]}

Nikitenko, M. S. ^{[3
]}

机构：

[1] Chaplygin Siberian Aeronaut Res Inst, Novosibirsk, Russia

[2] Siberian Transport Univ, Novosibirsk, Russia

[3] Kuzbass State Tech Univ, Kemerovo, Russia

来源：

AUTOMATION AND REMOTE CONTROL | 2013年 / 74卷 / 05期

关键词：

Remote Control; Output Voltage; Central Processing Unit; Random Access Memory; Measuring Transducer;

D O I：

10.1134/S0005117913050135

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

In this paper we consider design principles for three high-performance microprocessor multi-channel strain-gauge systems used in dynamic tests of different structures (endurance tests of alighting gears, mobile control of wagon wheels, etc.). It is underlined that, in contrast to well-known systems, strain gauges power supply is performed by direct current. To avoid the impact of self-heating temperature errors on measurement results, strain gauges power supply is activated for short periods to measure the deformations of a structure.

引用

页码：891 / 897

页数：7

共 50 条

[1] Microprocessor multi-channel strain-gauge systems for dynamic tests of structures
L. N. Stepanova
S. I. Kabanov
S. A. Bekher
M. S. Nikitenko
[J]. Automation and Remote Control, 2013, 74 : 891 - 897
[2] STRAIN-GAUGE TESTS
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[3] DYNAMIC STRAIN-GAUGE
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