Study of Fault Diagnosis System of WAS Intelligent Circuit Board

被引：0

作者：

Luo Yun-Lin ^{[1
]}

Du Cong ^{[1
]}

机构：

[1] Civil Aviat Univ China, Aeronaut Automat Coll, Tianjin 300300, Peoples R China

来源：

2008 CHINESE CONTROL AND DECISION CONFERENCE, VOLS 1-11 | 2008年

关键词：

TCAS; Intelligent Circuit Board; Fault Testing;

D O I：

10.1109/CCDC.2008.4597364

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

Nowadays, the test equipments for TCAS (Traffic - alert and Collision Avoidance System) can only test troubles of shooting boards, but it can not find the detailed fault components. It is difficult to test intelligent circuit board (circuit board with CPU) with finding the detailed fault components of the trouble boards. This paper introduces a new way of fault testing of circuit board with CPU and how to accomplish it.

引用

页码：514 / 518

页数：5