Progress and Challenges of Test Technologies for 5G

被引：1
|
作者：
Jiang, Zhengbo [1 ]
Hong, Wei [1 ]
Zhang, Nianzu [1 ]
Yu, Chao [1 ]
Su, Tianze [2 ]
机构：
[1] Southeast Univ, Nanjing, Jiangsu, Peoples R China
[2] Shanghai Transcom Instrument Technol Co Ltd, Shanghai, Peoples R China
来源：
MICROWAVE JOURNAL | 2018年 / 61卷 / 01期
基金：
中国国家自然科学基金;
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The 5G test system must closely integrate pre-research results with practice at all stages, providing researchers and developers with flexible, efficient and reliable test platforms and test data to accelerate the commercialization of 5G products. In this article, we introduce the testing requirements and challenges running through different processes in the 5G industry. Combined with various test scenarios, the test industry's current R&D status is summarized, technical challenges faced by instrument researchers and developers are highlighted and the potential development of 5G test is forecast.
引用
收藏
页码：80 / 94
页数：15
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