High precision high voltage divider and its application to electron beam ion traps

被引:7
|
作者
Chen, W. D. [1 ]
Xiao, J.
Shen, Y.
Fu, Y. Q.
Meng, F. C.
Chen, C. Y.
Zou, Y.
Hutton, R.
机构
[1] Fudan Univ, Shanghai EBIT Lab, Inst Modern Phys, Shanghai 200433, Peoples R China
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2008年 / 79卷 / 12期
基金
中国国家自然科学基金;
关键词
capacitors; electron sources; ion recombination; particle traps; resistors; space charge; voltage dividers; xenon;
D O I
10.1063/1.3053449
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A high precision high voltage divider has been developed for the electron beam ion trap in Shanghai. The uncertainty caused by the temperature coefficient of resistance (TCR) and the voltage coefficient of resistance has been studied in detail and was minimized to the level of ppm (10(-6)) range. Once the TCR was matched between the resistors, the precision of the dividing ratio finally reached the ppm range also. We measured the delay of the divider caused by the capacitor introduced to minimize voltage ripple to be 2.35 ms. Finally we applied the divider to an experiment to measure resonant energies for some dielectronic recombination processes for highly charged xenon ions. The final energies include corrections for both space charge and fringe field effects are mostly under 0.03%.
引用
收藏
页数:7
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