Energy dispersive X-ray spectroscopy (EDS)

被引：0
|
作者：
Oikawa, T [1 ]
机构：
[1] JEOL Ltd, Electron Opt Div, Akishima, Tokyo 1968558, Japan
来源：
JOURNAL OF JAPANESE SOCIETY OF TRIBOLOGISTS | 2006年 / 51卷 / 02期
关键词：
elemental analysis; TEM; SEM; STEM; HAADF;
D O I：
暂无
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
引用
收藏
页码：122 / 126
页数：5
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