Time-of-Flight Measurements on Schottky CdTe Detectors

被引：7

作者：

Suzuki, Kazuhiko ^{[1
]}

Sawada, Takayuki ^{[1
]}

Imai, Kazuaki ^{[1
]}

Seto, Satoru ^{[2
]}

机构：

[1] Hokkaido Inst Technol, Sapporo, Hokkaido 0068585, Japan

[2] Ishikawa Natl Coll Technol, Tsubata, Ishikawa 9290392, Japan

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2012年 / 59卷 / 04期

关键词：

CdTe; electric field distribution; Monte Carlo simulation; polarization; time-of-flight; RADIATION DETECTORS; POLARIZATION;

D O I：

10.1109/TNS.2012.2193599

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The internal electric field distribution of Schottky barrier CdTe detectors was evaluated by using time-of-flight (TOF) measurements combined with Monte Carlo (MC) simulation. The evolution of the current waveforms from less than 1 s up to about 1300 s of DC bias duration was measured at room temperature. The observed temporal behavior of the current waveforms was well reproduced by MC simulation with simple linear variation of the electric field strength distribution with position x from the anode electrode. These observations indicate accumulation of negative space charges, which screens the applied electric field progressively from the cathode side toward the bulk. Based on the evolution of the current waveforms we can successfully extract the temporal evolution of electric field distribution characterized by triple exponential function.

引用

页码：1522 / 1525

页数：4

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