All-silicon and epitaxially grown III-V-on-silicon photodetectors for on-chip optical interconnection applications

被引:0
|
作者
Poon, Andrew W. [1 ]
Feng, Shaoqi [1 ]
Li, Yu [1 ]
Geng, Yu [1 ]
Lau, Kei May [1 ]
机构
[1] Hong Kong Univ Sci & Technol, Dept Elect & Comp Engn, Clear Water Bay, Hong Kong, Peoples R China
来源
关键词
Silicon photonics; optical interconnects; photodetectors; semiconductor defects; pn diode; metal-organic chemical vapor deposition (MOCVD); selective area growth; INFRARED PHOTODIODES;
D O I
10.1117/12.2006565
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper we review our recent progress in two complementary approaches to photodetectors on silicon photonic chips for on-chip optical interconnection applications, namely epitaxially grown III-V-on-silicon and all-silicon microcavity-enhanced photodetectors, both for the 1550nm wavelengths. On the epitaxially grown III-V-on-silicon photodetectors front, we have demonstrated both normal-incidence and waveguide-butt-coupled p-i-n photodetectors. We simulate the silicon waveguide butt-coupling to the InGaAs absorption region and estimate the absorption efficiency using a three-dimensional finite-difference time-domain method. We optimize the InGaAs absorption region in order to attain a bandwidth of 46 GHz. We also report our latest experimental demonstration of all-silicon microresonator-enhanced linear-absorption photodetectors using defect-state absorption in pn-diode-integrated microresonators. Our initial experiments reveal the measured bandwidths to be exceeding 10 GHz.
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页数:10
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