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Electrical properties of vacuum-evaporated CdTe thin films

被引：1
|
作者：
Sahay, PP [1 ]
Jha, S
Shamsuddin, M
机构：
[1] Reg Engn Coll, Dept Phys, Silchar 788010, India
[2] Banaras Hindu Univ, Inst Technol, Dept Met Engn, Varanasi 221005, Uttar Pradesh, India
来源：
JOURNAL OF MATERIALS SCIENCE LETTERS | 2001年 / 20卷 / 21期
关键词：
D O I：
10.1023/A:1013126517075
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Electrical properties of vacuum-evaporated CdTe thin films was investigated. The films were prepared by thermal evaporation technique in a vacuum and resistance was measured using Keithley Programmable Electrometer. X-ray diffraction studies showed that the films had a polycrystalline nature and belonged to the cubic system with a preferred orientation along the (111) direction. The sheet resistance was found to decrease with an increase in film thickness. The electrical behavior of the films was explained using a polycrystalline model for semiconductors.
引用
收藏
页码：1933 / 1935
页数：3
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