Characterization of organic thin film materials with near-field scanning optical microscopy (NSOM)

被引：51
|
作者：
Barbara, PF [1 ]
Adams, DM [1 ]
O'Connor, DB [1 ]
机构：
[1] Univ Texas, Dept Chem & Biochem, Austin, TX 78712 USA
来源：
ANNUAL REVIEW OF MATERIALS SCIENCE | 1999年 / 29卷
关键词：
chemical contrast; spectroscopic imaging; polarization spectroscopy; self-assembly; energy migration;
D O I：
10.1146/annurev.matsci.29.1.433
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Recent progress on the use of near-field scanning optical microscopy (NSOM) to characterize organic thin film materials is extensively reviewed. NSOM is leading to important new information on the morphology and spatially resolved optical properties of a variety of materials, complementing more widely available methods for thin film analysis. Materials described in this review include polymer thin films, molecular aggregates, molecular crystals, molecular semiconductor hetero-junctions, biological materials, and molecular mono-, bi-, and multi-layer films.
引用
收藏
页码：433 / +
页数：49
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