Measurement and analysis of x-ray absorption in Al and MgF2 plasmas heated by Z-pinch radiation -: art. no. 066405

被引:17
|
作者
Rochau, GA [1 ]
Bailey, JE
MacFarlane, JJ
机构
[1] Sandia Natl Labs, Albuquerque, NM 87185 USA
[2] Prism Computat Sci, Madison, WI 53704 USA
来源
PHYSICAL REVIEW E | 2005年 / 72卷 / 06期
关键词
D O I
10.1103/PhysRevE.72.066405
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
High-power Z pinches on Sandia National Laboratories' Z facility can be used in a variety of experiments to radiatively heat samples placed some distance away from the Z-pinch plasma. In such experiments, the heating radiation spectrum is influenced by both the Z-pinch emission and the re-emission of radiation from the high-Z surfaces that make up the Z-pinch diode. To test the understanding of the amplitude and spectral distribution of the heating radiation, thin foils containing both Al and MgF2 were heated by a 100-130 TW Z pinch. The heating of these samples was studied through the ionization distribution in each material as measured by x-ray absorption spectra. The resulting plasma conditions are inferred from a least-squares comparison between the measured spectra and calculations of the Al and Mg 1s -> 2p absorption over a large range of temperatures and densities. These plasma conditions are then compared to radiation-hydrodynamics simulations of the sample dynamics and are found to agree within 1 sigma to the best-fit conditions. This agreement indicates that both the driving radiation spectrum and the heating of the Al and MgF2 samples is understood within the accuracy of the spectroscopic method.
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页数:11
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