共 3 条
Proceedings of the International Workshop towards Atomic Resolution Analysis - Port Ludlow, Washington, USA, 6-11 September 1998 - Part 1: Techniques and instrumentation - Foreword
被引:0
|作者:
Krivanek, O
[1
]
Leapman, R
Sarikaya, M
机构:
[1] Univ Washington, Seattle, WA 98195 USA
[2] NIH, Bethesda, MD 20892 USA
关键词:
D O I:
暂无
中图分类号:
TH742 [显微镜];
学科分类号:
摘要:
引用
收藏
页码:IX / IX
页数:1
相关论文