First performance results of the ASML alpha demo tool

被引:0
|
作者
Meiling, Hans [1 ]
Meijer, Henk [1 ]
Banine, Vadim [1 ]
Moors, Roel [1 ]
Groeneveld, Rogier [1 ]
Vorma, Hann-Jan [1 ]
Mickan, Uwe [1 ]
Wolschrijn, Bas [1 ]
Mertens, Bas [1 ]
van Baars, Gregor [1 ]
Kuerz, Peter [1 ]
Harned, Noreen [1 ]
机构
[1] ASML Netherlands BV, NL-5504 DR Veldhoven, Netherlands
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O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The ASML EUV alpha demo tool is operational! The alpha demo tool is a 0.25NA fully functional lithography tool with a field size of 26x33 mm(2), enabling process development at the 40-nm technology node. In this paper we describe the tool performance, show that vacuum is achieved in a few hours, and demonstrate that our optics contamination strategy mitigates degradation of the optics. Additional data shows the Sri source cost-of-ownership to be comparable to state-of-the-art ArF source systems, by implementing a collector contamination mitigation strategy that includes cleaning. And, we present our first 35-nm dense lines and spaces (half pitch) resist images.
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页码:XLV / LVI
页数:12
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