Characterization of Measurement System for High-Precision Oscillator Measurements

被引：0
|
作者：
Brezovec, Ivan [1 ]
Magerl, Marko [1 ]
Mikulic, Josip [2 ]
Schatzberger, Gregor [2 ]
Baric, Adrijan [1 ]
机构：
[1] Univ Zagreb, Fac Elect Engn & Comp, Unska 3, Zagreb, Croatia
[2] Ams AG, Tobelbader Str 30, A-8141 Premstaetten, Austria
来源：
2017 40TH INTERNATIONAL CONVENTION ON INFORMATION AND COMMUNICATION TECHNOLOGY, ELECTRONICS AND MICROELECTRONICS (MIPRO) | 2017年
关键词：
oscillator characterization; temperature calibration; on-chip temperature sensor; Allan deviation;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
Temperature stability of a high-precision oscillator is characterized by measurements in a temperature chamber. Two time constants are measured for a given temperature of the chamber: (i) time required for the silicon to reach the steady-state temperature obtained by measuring the time-domain voltage response of the on-chip temperature sensor; (ii) time required for the oscillator circuit to reach the steady-state frequency obtained by measuring the oscillator frequency in the time-domain. The temperature probe for measuring the chamber temperature is characterized in terms of its response to a step in temperature. The noise performance of the measurement system is characterized based on Allan deviation.
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页码：88 / 92
页数：5
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