The ultimate detection limits of electron energy-loss spectroscopy

被引:0
|
作者
Natusch, MKH [1 ]
Botton, GA [1 ]
Humphreys, CJ [1 ]
Krivanek, OL [1 ]
机构
[1] Univ Cambridge, Dept Mat Sci & Met, Cambridge CB2 3QZ, England
来源
ELECTRON | 1998年
关键词
D O I
暂无
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
We develop the methodology to predict spectral signal-to-noise ratios (SNRs) of electron energy-loss spectroscopy (EELS) by computing spectra taking account of valence electron excitations, inner-shell excitations and elastic scattering together with the noise characteristics of the detection system. The consideration of multiple scattering in our model allows us to apply it to a wide range of specimen thicknesses and collection angles. The detectability of an element is judged by the SNR. The calculated SNRs at the oxygen and magnesium K-edges in MgO agree well with experiment.
引用
收藏
页码:476 / 483
页数:4
相关论文
共 50 条
  • [1] Modelling of electron energy-loss spectroscopy detection limits
    Natusch, MKH
    Botton, GA
    Humphreys, CJ
    Krivanek, OL
    ELECTRON MICROSCOPY AND ANALYSIS 1997, 1997, (153): : 339 - 342
  • [2] Detection limits in electron energy-loss spectroscopy and energy-filtered imaging
    Natusch, MKH
    Botton, GA
    Krivanek, OL
    Humphreys, CJ
    ELECTRON MICROSCOPY 1998, VOL 3: MATERIALS SCIENCE 2, 1998, : 651 - 652
  • [3] Experimental and theoretical study of the detection limits in electron energy-loss spectroscopy
    Natusch, MKH
    Humphreys, CJ
    Menon, N
    Krivanek, OL
    MICRON, 1999, 30 (02) : 173 - 183
  • [4] Limits to the spatial, energy and momentum resolution of electron energy-loss spectroscopy
    Egerton, R. F.
    ULTRAMICROSCOPY, 2007, 107 (08) : 575 - 586
  • [5] Direct Detection Electron Energy-Loss Spectroscopy: A Method to Push the Limits of Resolution and Sensitivity
    Hart, James L.
    Lang, Andrew C.
    Leff, Asher C.
    Longo, Paolo
    Trevor, Colin
    Twesten, Ray D.
    Taheri, Mitra L.
    SCIENTIFIC REPORTS, 2017, 7
  • [6] Direct Detection Electron Energy-Loss Spectroscopy: A Method to Push the Limits of Resolution and Sensitivity
    James L. Hart
    Andrew C. Lang
    Asher C. Leff
    Paolo Longo
    Colin Trevor
    Ray D. Twesten
    Mitra L. Taheri
    Scientific Reports, 7
  • [7] ELECTRON ENERGY-LOSS SPECTROSCOPY
    WILLIAMS, BG
    PROGRESS IN SOLID STATE CHEMISTRY, 1987, 17 (02) : 87 - 143
  • [8] ELECTRON ENERGY-LOSS SPECTROSCOPY
    JOY, DC
    MAHER, DM
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1980, 13 (03): : 260 - 270
  • [9] Electron energy-loss spectroscopy
    Egerton, R
    PHYSICS WORLD, 1997, 10 (04) : 47 - 51
  • [10] TRANSMISSION ELECTRON ENERGY-LOSS SPECTROSCOPY
    FINK, J
    TOPICS IN APPLIED PHYSICS, 1992, 69 : 203 - 241