Resonant X-ray scattering studies of epitaxial complex oxide thin films

被引：5

作者：

Perret, Edith ^{[1
]}

Park, Changyong ^{[2
]}

Fong, Dillon D. ^{[1
]}

Chang, Kee-Chul ^{[1
]}

Ingram, Brian J. ^{[3
]}

Eastman, Jeffrey A. ^{[1
]}

Baldo, Peter M. ^{[1
]}

Fuoss, Paul H. ^{[1
]}

机构：

[1] Argonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA

[2] Carnegie Inst Sci, HPCAT, Geophys Lab, Argonne, IL 60439 USA

[3] Argonne Natl Lab, Chem Sci & Engn Div, Argonne, IL 60439 USA

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2013年 / 46卷

基金：

美国国家科学基金会;

关键词：

SURFACE-STRUCTURE DETERMINATION; FULVIC-ACID; ADSORPTION; INTERFACE; REFLECTIVITY; (001)-WATER; DISPERSION; EXPANSION; STRONTIUM; COPPER;

D O I：

10.1107/S0021889812047620

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Resonant anomalous X-ray reflectivity (RAXR) is a powerful technique for measuring element-specific distribution profiles across surfaces and buried interfaces. Here, the RAXR technique is applied to characterize a complex oxide heterostructure, La0.6Sr0.4Co0.2Fe0.8O3-delta, on NdGaO3, and the effects of data sampling and model-dependent fitting procedures on the extracted elemental distribution profile are evaluated. The strontium profile through a 3.5 nm-thick film at 973 K and at an oxygen partial pressure of 150 Torr (1 Torr = 133.32 Pa) was determined from the measured RAXR spectra. The results demonstrate that in situ RAXR measurements can provide key insights into temperature-and environment-dependent elemental segregation processes, relevant, for example, in assessing the cathode performance of solid oxide fuel cells.

引用

页码：76 / 87

页数：12

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