Preemptive system-on-chip test scheduling

被引:0
|
作者
Larsson, E [1 ]
机构
[1] Linkoping Univ, Embedded Syst Lab, SE-58183 Linkoping, Sweden
[2] Nara Inst Sci & Technol, Comp Design & Test Lab, Ikoma 6300101, Japan
来源
关键词
test scheduling; test access mechanism design; preemptive scheduling; system-on-chip testing;
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper, we propose a preemptive test scheduling technique (a test can be interrupted and later resumed) for core-based systems with the objective to minimize the test application time. We make use of reconfigurable core test wrappers in order to increase the flexibility in the scheduling process. The advantage with such a wrapper is that it is not limited to a single TAM (test access mechanism) bandwidth (wrapper chain configuration) at each core. We model the scheduling problem as a Bin-packing problem, and we discuss the transformation: number of TAM wires (wrapper-chains) versus test time in combination with preemption, as well as the possibilities and the limitations to achieve an optimal solution in respect to test application time. We have implemented the proposed preemptive test scheduling algorithm, and we have through experiments demonstrated its efficiency.
引用
收藏
页码:620 / 629
页数:10
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