InN nano rods and epitaxial layers grown by HVPE on sapphire substrates and GaN, AlGaN, AlN templates.

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作者
Syrkin, A. [1 ]
Usikov, A. [1 ]
Soukhoveev, V. [1 ]
Kovalenkov, O. [1 ]
Ivantsov, V. [1 ]
Dmitriev, V. [1 ]
Collins, C. [2 ]
Readinger, E. [2 ]
Shmidt, N. [3 ]
Nikishin, S. [4 ]
Kuryatkov, V. [4 ]
Song, D. [4 ]
Holtz, M. [4 ]
机构
[1] Technol & Devices Int Inc, 12214 Plum Orchard Dr, Silver Spring, MD 20904 USA
[2] US Army Res Lab, Adelphi, MD 20783 USA
[3] Ioffe Phys Tech Inst, St Petersburg 194021, Russia
[4] Texas Tech Univ, Lubbock, TX 79409 USA
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T [工业技术];
学科分类号
08 ;
摘要
This paper contains results on InN growth by Hydride Vapor Phase Epitaxy (HVPE) on various substrates including sapphire, GaN/sapphire, AlGaN/sapphire, and AlN/sapphirci templates. The growth processes were carried out at atmospheric pressure in a hot wall reactor in the temperature range from 500 to 650 degrees C. Arrays of nano-crystalline InN rods with various shapes were grown directly on sapphire substrates. Continuous InN layers were grown on GaN/sapphire, AlN/sapphire and AlGaN/sapphire template substrates. X-ray diffraction rocking curves for the (00.2) InN reflection exhibit the full width at half maximum (FWHM) as narrow as 0.075 deg. for the nano-rods and 0.128 deg. for the continuous layers grown on GaN/sapphire templates.
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页码:151 / +
页数:2
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