Electron and optical beam testing of electronic devices - Proceedings of the Fifth European Conference on Electron and Optical Beam Testing of Electronic Devices - August 27-30, 1995, Wuppertal, Germany - Preface

被引：0

|

作者：

Wolfgang, E

Courtois, B

Balk, LJ

机构：

来源：

MICROELECTRONIC ENGINEERING | 1996年 / 31卷 / 1-4期

关键词：

D O I：

10.1016/S0167-9317(96)90012-X

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：R7 / R8

页数：2

相关论文

共 5 条

[1] SPECIAL ISSUE ON ELECTRON AND OPTICAL BEAM TESTING OF ELECTRONIC DEVICES - PROCEEDINGS OF THE 3RD EUROPEAN CONFERENCE ON ELECTRON AND OPTICAL BEAM TESTING OF ELECTRONIC DEVICES, SEPTEMBER 1-3, 1993, ZURICH, SWITZERLAND - PREFACE
BIROLINI, A
CIAPPA, M
WOLFGANG, E
[J]. MICROELECTRONIC ENGINEERING, 1994, 24 (1-4) : R7 - R7
[2] AN ELECTRON-BEAM-OPTICAL-HYBRID LITHOGRAPHY APPROACH TO SUBMICROMETER ELECTRONIC DEVICES
POTOSKY, JC
HIGGINS, AJ
HOELKE, ST
IMERSON, RG
KINOSHITA, FF
MADDOX, RL
REEKSTIN, JP
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (04): : 924 - 926
[3] ELECTRON AND OPTICAL BEAM TESTING OF INTEGRATED-CIRCUITS - PREFACE
MELGARA, M
WOLFGANG, E
COURTOIS, B
FANTINI, F
[J]. MICROELECTRONIC ENGINEERING, 1992, 16 (1-4) : R7 - R7
[4] Proceedings of the International Conference on Strongly Correlated Electron Systems - SCES '95 - Held in Goa, India 27-30 September 1995 - Preface
Vijayaraghavan, R
Nagarajan, V
[J]. PHYSICA B-CONDENSED MATTER, 1996, 223-24 (1-4) : R7 - R7
[5] Selected Papers from the 2nd International Conference on Physics of Optical Materials and Devices ICOM 2009 Herceg Novi, Montenegro, 27-30 August 2009 Preface
Dramicanin, Miroslav
Viana, Bruno
[J]. OPTICAL MATERIALS, 2010, 32 (12) : 1559 - 1559