Stochastic behavior of a two-unit cold standby redundant system subject to random failure

被引：2
|
作者：
Hyderi, PD
Joorel, JPS
机构：
[1] Dr. Y. S. Parmar, Univ. of Horticulture and Forestry
来源：
MICROELECTRONICS AND RELIABILITY | 1996年 / 36卷 / 02期
关键词：
D O I：
10.1016/0026-2714(95)00011-P
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The present paper deals with a stochastic model of a two-unit cold standby redundant system subject to random failure. The random failure occurs at random times which follow an exponential distribution. Using a regenerative point technique in the Markov-renewal process, several reliability characteristics are obtained. The mean time to system failure function is studied graphically.
引用
收藏
页码：243 / 246
页数：4
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