Specific Measurements of Tilt with MEMS Accelerometers

被引：10
|
作者：
Luczak, S. [1 ]
机构：
[1] Warsaw Univ Technol, Inst Micromech & Photon, PL-02525 Warsaw, Poland
来源：
MECHATRONICS: RECENT TECHNOLOGICAL AND SCIENTIFIC ADVANCES | 2011年
关键词：
D O I：
10.1007/978-3-642-23244-2_85
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
The paper describes a specific kind of tilt measurements, where pitch of an axis is determined. The measurements are realized by means of MEMS accelerometers. Various mathematical formulas for computing the tilt are presented and results of their application, as well as the relevant requirements, are discussed. Experimental verification of the theoretical considerations is also presented, including values of an evaluated accuracy of the measurements performed by means of a tilt sensor built of two commercial MEMS accelerometers.
引用
收藏
页码：705 / 711
页数：7
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