Fourier images feature of lattice fringes formed by low-loss electrons as observed using spatially-resolved EELS technique

被引：5

作者：

Kimoto, K ^{[1
]}

Matsui, Y ^{[1
]}

机构：

[1] Natl Inst Mat Sci, Adv Mat Lab, Tsukuba, Ibaraki 3050044, Japan

来源：

JOURNAL OF ELECTRON MICROSCOPY | 2001年 / 50卷 / 05期

基金：

日本科学技术振兴机构;

关键词：

energy-filtering transmission electron microscopy; lattice fringe; inelastic scattering; low-loss electron; spatially-resolved EELS; Fourier images;

D O I：

10.1093/jmicro/50.5.377

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The lattice fringes of inelastically scattered electrons were investigated using spatially-resolved electron energy-loss spectroscopy (EELS) technique. The intensity profiles of lattice fringes formed by low-loss electrons were observed, and their position and contrast were elucidated with high spatial resolution. It was found that the conventional transmission electron microscope image includes low-loss images, which axe the integrated image of through-focus images weighted by the intensity of the EEL spectrum. The modulation feature in the lattice fringes of inelastically scattered electrons is similar to the Fourier images. It means that the exit wave field of elastically scattered electrons is almost preserved in that of low-loss electrons.

引用

页码：377 / 382

页数：6