Exchange bias in ferromagnetic/antiferromagnetic bilayers

被引:1
|
作者
Hu, JG [1 ]
Jin, GJ
Ma, YQ
机构
[1] Nanjing Univ, Natl Lab Solid State Microstruct, Nanjing 210093, Peoples R China
[2] Nanjing Univ, Dept Phys, Nanjing 210093, Peoples R China
[3] Yangzhou Univ, Dept Phys, Yangzhou 225002, Peoples R China
来源
MODERN PHYSICS LETTERS B | 2001年 / 15卷 / 24期
基金
中国国家自然科学基金;
关键词
D O I
10.1142/S0217984901002890
中图分类号
O59 [应用物理学];
学科分类号
摘要
We present a theoretical investigation on the thickness dependence of exchange bias in ferromagnetic (FM)/antiferromagnetic (AFM) bilayer systems, in which the exchange coupling at the interface between the FM layer and the AFM layer includes both bilinear (direct exchange) and biquadratic (spin-flop) terms. Based on the above model, the basic formula is derived for the first time. From the formula, a lot of interesting facts can be extracted, and a number of recent experimental results can be illustrated. We find that the exchange bias linearly depends on the reciprocal of FM layer thickness. However, another factor is the switching thickness of the AFM layer to display exchange bias, which approaches saturation with a relatively thick AFM layer. In general, the biquadratic term reduces exchange bias. When the biquadratic coupling is properly selected, the discrepancies in the previous theories and experiments can be efficiently eliminated.
引用
收藏
页码:1087 / 1093
页数:7
相关论文
共 50 条
  • [1] Exchange Bias in Ferromagnetic/Antiferromagnetic Manganite Bilayers
    Gomez, M. E.
    Marin, L.
    Ramirez, J. -G.
    Prieto, P.
    [J]. WOMEN IN PHYSICS, 2013, 1517 : 226 - 226
  • [2] Exchange bias in ferromagnetic/compensated antiferromagnetic bilayers
    Deng, DS
    Jin, XF
    Tao, RB
    [J]. PHYSICAL REVIEW B, 2002, 65 (17): : 1724021 - 1724024
  • [3] Size dependence of exchange bias in ferromagnetic/antiferromagnetic bilayers
    Zhang, S
    Li, Z
    [J]. PHYSICAL REVIEW B, 2002, 65 (05) : 1 - 4
  • [4] Exchange bias of ferromagnetic/antiferromagnetic in FePt/FeRh bilayers
    Nam, Nguyen T.
    Lu, W.
    Suzuki, T.
    [J]. JOURNAL OF APPLIED PHYSICS, 2009, 105 (07)
  • [5] Exchange bias in ferromagnetic/antiferromagnetic bilayers with imperfect interfaces
    Spray, J.
    Nowak, U.
    [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2006, 39 (21) : 4536 - 4539
  • [6] Ising model for exchange bias in ferromagnetic/antiferromagnetic bilayers
    Negulescu, B
    Tanasa, R
    Stancu, A
    [J]. JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2004, 6 (03): : 991 - 994
  • [7] The structure dependence of exchange bias in ferromagnetic/antiferromagnetic bilayers
    许小勇
    王茂华
    胡经国
    [J]. Chinese Physics B, 2008, 17 (04) : 1443 - 1447
  • [8] The structure dependence of exchange bias in ferromagnetic/antiferromagnetic bilayers
    Xiao-Yong, Xu
    Mao-Hua, Wang
    Jing-Guo, Hu
    [J]. CHINESE PHYSICS B, 2008, 17 (04) : 1443 - 1447
  • [9] Thickness and angular dependencies of exchange bias in ferromagnetic/antiferromagnetic bilayers
    Hu, JG
    Jin, GJ
    Ma, YQ
    [J]. JOURNAL OF APPLIED PHYSICS, 2002, 92 (02) : 1009 - 1013