Reliability Properties of Solderable Conductive Adhesives with Low-Melting-Point Alloy Fillers

被引:14
|
作者
Yim, Byung-Seung [1 ]
Lee, Jeong Il [1 ]
Heo, Yuseon [2 ]
Kim, Jooheon [2 ]
Lee, Seong Hyuk [1 ]
Shin, Young-Eui [1 ]
Kim, Jong-Min [1 ]
机构
[1] Chung Ang Univ, Sch Mech Engn, Seoul 156756, South Korea
[2] Chung Ang Univ, Sch Chem Engn & Mat Sci, Seoul 156756, South Korea
关键词
anisotropic conductive adhesive; coalescence; fluxing capability; intermetallic compounds; low-melting-point alloy; reliability; solderable conductive adhesive; wettability; CONTACT RESISTANCE; JOINTS; FILM; AG;
D O I
10.2320/matertrans.MB201207
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A solderable conductive adhesive (SCA) using low-melting-point alloy (LMPA) filler was developed to overcome the limitations of conventional electrically conductive adhesives (ECAs), which include their low electrical conductivity, increased contact resistance, and low joint strength. The SCA formed good metallurgical conduction path between the corresponding electrodes due to the rheology-coalescence-wetting behaviors of molten LMPA fillers in SCA. This study examined the reliability of SCA assembly through the thermal shock test (218 to 398 K, 1000 cycles) and the high temperature and high humidity test (358K/85% RH, 1000 h). The electrical resistance of the SCA assembly with metallurgical interconnections was much more stable than those with conventional ICAs. Before the reliability tests, a scallop-type Cu6Sn5 (eta-phase) intermetallic compound (IMC) layer was formed on the Sn-plated Cu lead/LMPA and LMPA/Cu metallization interface based on the results of interfacial microstructure observations of quad flat packages (QFPs) that were assembled with SCA. After the reliability tests, the thickness of IMC layer increased with time, and Cu6Sn5 (eta-phase) and Cu3Sn (epsilon-phase) were formed. In addition, the fracture surface exhibited a cleavage fracture mode with the fracture propagating along the Cu-Sn IMC/Sn-Bi interface. These results demonstrate that SCA assembly with metallurgical interconnection has stable electrical and mechanical bonding characteristics.
引用
收藏
页码:2104 / 2110
页数:7
相关论文
共 50 条
  • [1] Hybrid Interconnection Process Using Solderable ICAs (Isotropic Conductive Adhesives) with Low-Melting-Point Alloy Fillers
    Yim, Byung-Seung
    Kim, Jong-Min
    Jeon, Sung-Ho
    Lee, Seong Hyuk
    Kim, Jooheon
    Han, Jung-Geun
    Cho, Minhaeng
    [J]. MATERIALS TRANSACTIONS, 2009, 50 (11) : 2649 - 2655
  • [2] Development of conductive adhesives filled with low-melting-point alloy fillers
    Lu, DQ
    Wong, CP
    [J]. INTERNATIONAL SYMPOSIUM ON ADVANCED PACKAGING MATERIALS: PROCESSES, PROPERTIES AND INTERFACES, PROCEEDINGS, 2000, : 7 - 13
  • [3] Isotropic conductive adhesives filled with low-melting-point alloy fillers
    Lu, DQ
    Wong, CP
    [J]. IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING, 2000, 23 (03): : 185 - 190
  • [4] New electrically conductive adhesives filled with low-melting-point alloy fillers
    Kim, JM
    Yasuda, K
    Rito, M
    Fujimoto, K
    [J]. MATERIALS TRANSACTIONS, 2004, 45 (01) : 157 - 160
  • [5] An investigation of the reliability of solderable ICA with low-melting-point alloy (LMPA) filler
    Yim, Byung-Seung
    Lee, Jeong Il
    Lee, Byung Hun
    Shin, Young-Eui
    Kim, Jong-Min
    [J]. MICROELECTRONICS RELIABILITY, 2014, 54 (12) : 2944 - 2950
  • [6] Ball Grid Array Interconnection Properties of Solderable Polymer-Solder Composites With Low-Melting-Point Alloy Fillers
    Yim, Byung-Seung
    Shin, Young-Eui
    Kim, Jong-Min
    [J]. JOURNAL OF ELECTRONIC PACKAGING, 2017, 139 (04)
  • [7] A low-melting-point alloy filled epoxy conductive adhesives as thermal interface materials
    Kang, Jia-Hui
    Sheng, Jia-Li
    Fu, Xian-Zhu
    Sun, Rong
    Wong, Ching-Ping
    [J]. 2017 18TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2017, : 831 - 834
  • [8] Three-dimensional multi-layer through-hole filling properties of solderable polymer composites with low-melting-point alloy fillers
    Lee, Jeong Il
    Yim, Byung-Seung
    Shin, Dongjun
    Kim, Jong-Min
    [J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2016, 27 (06) : 6223 - 6231
  • [9] Three-dimensional multi-layer through-hole filling properties of solderable polymer composites with low-melting-point alloy fillers
    Jeong Il Lee
    Byung-Seung Yim
    Dongjun Shin
    Jong-Min Kim
    [J]. Journal of Materials Science: Materials in Electronics, 2016, 27 : 6223 - 6231
  • [10] Characteristics of Isotropically Conductive Adhesive (ICA) Filled with Carbon Nanotubes (CNTs) and Low-Melting-Point Alloy Fillers
    Yim, Byung-Seung
    Kim, Jong-Min
    [J]. MATERIALS TRANSACTIONS, 2010, 51 (12) : 2329 - 2331