Erbium enhanced formation and growth of photoluminescent Er/Si nanocrystals

被引:10
|
作者
Mustafa, Danilo [1 ]
Biggemann, Daniel [2 ]
Martens, Johan A. [1 ]
Kirschhock, Christine E. A. [1 ]
Tessler, Leandro R. [3 ]
Breynaert, Eric [1 ]
机构
[1] KULeuven, Ctr Surface Chem & Catalysis, Dept Microbial & Mol Syst, B-3001 Heverlee, Belgium
[2] LNLS, Lab Nacl Luz Sincrotron, BR-13083970 Campinas, SP, Brazil
[3] Univ Estadual Campinas, UNICAMP, Inst Fis Gleb Wataghin, BR-13083970 Campinas, SP, Brazil
基金
巴西圣保罗研究基金会;
关键词
Silicon; Nanocrystals; Erbium; Photoluminescence; Disproportionation; SIOX THIN-FILMS; ENERGY-TRANSFER; 1.54-MU-M LUMINESCENCE; SILICON NANOPARTICLES; POROUS SILICON; RICH SIO2; ER; EMISSION; CLUSTERS; CENTERS;
D O I
10.1016/j.tsf.2013.03.027
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Photoluminescent Er/Si-nanocrystal composites were obtained after annealing Er doped silicon suboxide (SiOx) thin films. The filmswere prepared by reactive sputtering (Ar/O-2 atmosphere) with a pure silicon target partially covered with metallic Er. The presence of Er in the resulting films strongly influences Si nanocrystal nucleation and growth during thermal treatment at temperatures between 300 and 1300 degrees C. A correlation between Er photoluminescence (PL) spectra, Er speciation and Si nanocrystal properties indicated that PL bands and their intensity are directly influenced by the nanocrystal size and density, and their vicinity to the Er3+ centers. This correlation is explained by considering Er centers as promotor for SiOx disproportionation, locally increasing SiOx concentration which leads to formation of Si-0 nanocrystals in the vicinity of Er. (C) 2013 Elsevier B.V. All rights reserved.
引用
收藏
页码:196 / 201
页数:6
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