Updating of the control system of a scanning Auger microprobe PHI 595

被引：0

作者：

Marchal, F

Louette, P

Sporken, R

Veldekens, JF

Caudano, R

机构：

来源：

VIDE-SCIENCE TECHNIQUE ET APPLICATIONS | 1996年 / 52卷 / 279期

关键词：

D O I：

暂无

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：103 / 104

页数：2

共 50 条

[1] Scanning Auger microprobe
Eckelmeyer, K. H.
[J]. ADVANCED MATERIALS & PROCESSES, 2008, 166 (06): : 45 - 47
[2] COMPUTERIZED SCANNING AUGER MICROPROBE
SOMMERER, TJ
HALE, EB
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (04): : 1874 - 1880
[3] COMPUTERIZED SCANNING AUGER MICROPROBE
SOMMERER, TJ
HALE, EB
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (03): : 526 - 526
[4] HIGH-PERFORMANCE SCANNING AUGER MICROPROBE
BOVEY, P
[J]. MIKROSKOPIE, 1978, 34 (5-6): : 177 - 177
[5] A SPIN POLARIZATION ANALYZER ATTACHMENT TO A SCANNING AUGER MICROPROBE
WELKIE, DG
[J]. SURFACE AND INTERFACE ANALYSIS, 1988, 11 (12) : 605 - 610
[6] AZIMUTHAL VARIATIONS OF SENSITIVITY IN THE COAXIAL SCANNING AUGER MICROPROBE
FRANK, L
[J]. SCANNING MICROSCOPY, 1990, 4 (01) : 79 - 87
[7] A MODIFIED SAMPLE INTRODUCTION SYSTEM FOR THE PERKIN-ELMER-545 SCANNING AUGER MICROPROBE
POTTER, TJ
BAIRD, RJ
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (04): : 2574 - 2575
[8] COMPARISON OF DEPTH PROFILES BETWEEN ION MICROPROBE MASS ANALYZER AND SCANNING AUGER MICROPROBE
BABA, Y
[J]. TETSU TO HAGANE-JOURNAL OF THE IRON AND STEEL INSTITUTE OF JAPAN, 1985, 71 (05): : S425 - S425
[9] INVESTIGATION OF THE CORROSION OF A BRAZED JOINT BY MEANS OF THE SCANNING AUGER MICROPROBE
BRANDL, W
BUBERT, H
HANTSCHE, H
JENETT, H
STEFFENS, HD
[J]. FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1987, 329 (2-3): : 298 - 304
[10] SEQUENTIAL ISS-AES MEASUREMENT WITH SCANNING AUGER MICROPROBE
SHIMIZU, R
KUROKAWA, A
[J]. SURFACE SCIENCE, 1986, 176 (03) : 653 - 656

← 1 2 3 4 5 →