Stand-Alone Surface Roughness Analyzer

被引:12
|
作者
Moslehpour, Saeid [1 ]
Campana, Claudio [1 ]
Shetty, Devdas [2 ]
Deryniosky, Brian [1 ,3 ]
机构
[1] Univ Hartford, Hartford, CT 06117 USA
[2] Lawrence Technol Univ, Coll Engn, Southfield, MI 48075 USA
[3] Sikorsky Aircraft, Stratford, CT 06614 USA
关键词
Cadence layout; light-scattering techniques; optical; portable roughness evaluator; surface roughness measurement;
D O I
10.1109/TIM.2008.2005820
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper details the design and implementation of a noncontact surface roughness probe from a PC-based data-acquisition system to a stand-alone measurement I instrument system. A Cadence layout for the fabrication of the printed circuit board (PCB), which interfaces and drives the surface roughness probe, was used to prototype this project.
引用
收藏
页码:698 / 706
页数:9
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