QUARTZ TUNING FORK ATOMIC FORCE MICROSCOPY USING A QUALITY-FACTOR CONTROL

被引：0
|
作者：
Tung, V. T. [1 ]
Chizhik, S. A. [1 ]
机构：
[1] NASB, Inst Heat & Mass Transfer, Minsk, BELARUS
来源：
PHYSICS, CHEMISTRY AND APPLICATION OF NANOSTRUCTURES: REVIEWS AND SHORT NOTES | 2007年
关键词：
D O I：
10.1142/9789812770950_0122
中图分类号：
O69 [应用化学];
学科分类号：
081704 ;
摘要：
The use of a quality-factor control device has been demonstrated to increase the resolution image of quartz twang fork with atomic force microscopy by lowering the quality factor Q of the oscillating probe. By electronically, Q-control has been implemented and used to decrease the quality factor of the quartz. tuning fork in air environment. Topographic images of the standard samples were used to demonstrate this technique.
引用
收藏
页码：535 / 538
页数：4
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