New Structured Illumination Technique for the Inspection of High-Reflective Surfaces: Application for the Detection of Structural Defects without any Calibration Procedures

被引:11
|
作者
Caulier, Yannick [1 ]
Spinnler, Klaus [1 ]
Bourennane, Salah [2 ]
Wittenberg, Thomas [1 ]
机构
[1] Fraunhofer Inst Integrierte Schaltungen IIS, D-91058 Erlangen, Germany
[2] Univ Aix Marseille 3, DU St Jerome, Ecole Cent Marseille, GSM,Inst Fresnel,CNRS UMR 6133, Marseille 20, France
关键词
D O I
10.1155/2008/237459
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We present a novel solution for automatic surface inspection of metallic tubes by applying a structured illumination. The strength of the proposed approach is that both structural and textural surface defects can be visually enhanced, detected, and well separated from acceptable surfaces. We propose a machine vision approach and we demonstrate that this technique is applicable in an industrial setting. We show that recording artefacts drastically increases the complexity of the inspection task. The algorithm implemented in the industrial application and which permits the segmentation and classification of surface defects is briefly described. The suggested method uses "perturbations from the stripe illumination" to detect, segment, and classify any defects. We emphasize the robustness of the algorithm against recording artefacts. Furthermore, this method is applied in 24 h/7 day real-time industrial surface inspection system. Copyright (C) 2008 Yannick Caulier et al.
引用
收藏
页数:14
相关论文
共 1 条
  • [1] New Structured Illumination Technique for the Inspection of High-Reflective Surfaces: Application for the Detection of Structural Defects without any Calibration Procedures
    Yannick Caulier
    Klaus Spinnler
    Salah Bourennane
    Thomas Wittenberg
    EURASIP Journal on Image and Video Processing, 2008