Nanoscale visualization and control of ferroelectric domains by atomic force microscopy - Comment

被引：7
|
作者：
Luthi, R
Meyer, E
机构：
来源：
PHYSICAL REVIEW LETTERS | 1996年 / 76卷 / 22期
关键词：
D O I：
10.1103/PhysRevLett.76.4291
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：4291 / 4291
页数：1
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