X-ray diffraction method for the determination of residual internal stresses in cement

被引:0
|
作者
Shchukin, ED [1 ]
Rybakova, LM [1 ]
Kuksenova, LI [1 ]
Amelina, EA [1 ]
机构
[1] RUSSIAN ACAD SCI,AA BLAGONRAVOV MECH ENGN INST,MOSCOW 101830,RUSSIA
关键词
D O I
暂无
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A new X-ray diffraction technique is developed, for the first time enabling the detection of internal microstresses (of the II mode) developing in cement hardening structures in the course of their formation, and macrostresses (of the I mode) caused by capillary forces during the removal of pore-confined water. Prospects of the application of this method are demonstrated for estimating the effect of various factors on the quality of cement materials.
引用
收藏
页码:90 / 95
页数:6
相关论文
共 50 条
  • [1] DETERMINATION OF CLAD PLATES RESIDUAL STRESSES BY X-RAY DIFFRACTION METHOD
    Matesa, Branko
    Kozuh, Zoran
    Dunder, Marko
    Samardzic, Ivan
    [J]. TEHNICKI VJESNIK-TECHNICAL GAZETTE, 2015, 22 (06): : 1533 - 1538
  • [2] A Deconvolution Method for the Mapping of Residual Stresses by X-Ray Diffraction
    Tajdary, P.
    Morin, L.
    Braham, C.
    Gonzalez, G.
    [J]. EXPERIMENTAL MECHANICS, 2022, 62 (08) : 1349 - 1362
  • [3] A Deconvolution Method for the Mapping of Residual Stresses by X-Ray Diffraction
    P. Tajdary
    L. Morin
    C. Braham
    G. Gonzalez
    [J]. Experimental Mechanics, 2022, 62 : 1349 - 1362
  • [4] Determination of global and local residual stresses in SOFC by X-ray diffraction
    Villanova, Julie
    Sicardy, Olivier
    Fortunier, Roland
    Micha, Jean-Sebastien
    Bleuet, Pierre
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2010, 268 (3-4): : 282 - 286
  • [5] Measurement of residual stresses in CFRP laminates by X-ray diffraction method
    C Balasingh
    Vandana Singh
    [J]. Bulletin of Materials Science, 1997, 20 : 325 - 332
  • [6] Measurement of residual stresses in CFRP laminates by X-ray diffraction method
    Balasingh, C
    Singh, V
    [J]. BULLETIN OF MATERIALS SCIENCE, 1997, 20 (03) : 325 - 332
  • [7] Determination of Loading and Residual Stresses on Offshore Jacket Structures by X-ray Diffraction
    Schubnell, Jan
    Carl, Eva
    Widerspan, Viktor
    Collmann, Mareike
    [J]. JOURNAL OF MARINE SCIENCE AND ENGINEERING, 2023, 11 (07)
  • [8] X-ray and neutron diffraction determination of residual stresses in a pressed and welded component
    Albertini, G
    Bruno, G
    Fiori, F
    Girardin, E
    Giuliani, A
    Quadrini, E
    [J]. PHYSICA B, 2000, 276 : 876 - 877
  • [9] X-ray diffraction & residual stresses in ferroelectric cathodes
    Ravi, M.
    Bhat, K. S.
    Krupanidhi, S. B.
    [J]. EIGHTH IEEE INTERNATIONAL VACUUM ELECTRONICS CONFERENCE, 2007, : 177 - +
  • [10] X-ray diffraction in thermal treatments: Determination of residual austenite by X-ray diffraction
    Bach, M
    Broll, N
    Cornet, A
    Gaide, L
    [J]. JOURNAL DE PHYSIQUE IV, 1996, 6 (C4): : 887 - 895