Step-stress accelerated test

被引：5
|
作者：
Lu, MW [1 ]
Rudy, RJ [1 ]
机构：
[1] Daimler Chrysler Corp, Auburn Hills, MI 48326 USA
来源：
INTERNATIONAL JOURNAL OF MATERIALS & PRODUCT TECHNOLOGY | 2002年 / 17卷 / 5-6期
关键词：
median rank; Monte Carlo simulation; reliability; step-stress accelerated test (SSAT); Weibull distribution;
D O I：
10.1504/IJMPT.2002.005468
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Most products are designed to operate for a long period of time, and in such case, life testing is a relatively lengthy procedure. Lengthy tests tend to be expensive and the result becomes available too late to be of much use. To reduce the experimental cost significantly and provide an efficient tool to assess the life distribution for highly reliable products, the Step-stress accelerated test (SSAT) was developed. An example of a SAE keyhole specimen made of RQC-100 is used to demonstrate the SSAT procedure.
引用
收藏
页码：425 / 434
页数：10
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