Influence of Sm-Mn Substitution on Structural, Dielectric and Electrical Properties of X-Type Hexagonal Nanoferrites

A series of Sm-Mn substituted X-type hexagonal ferrites with composition Sr2-xSmxNi2Fe28-yMnyO46 (x=0.02, 0.04, 0.06, 0.08, .010 and y= 0.1, 0.2, 0.3, 0.4, 0.5) have been synthesized by sol gel method. The temperature at which required phase has been obtained was confirmed from the TGA/DSC analysis. X-Rays Diffraction analysis reveals the single phase of the prepared material. The lattice parameters and unit cell volume change with substitution of Sm-Mn contents. SEM and TEM analysis indicates that the crystallite size lies in the range of 60-80 nm. The dielectric constant decreases with the increase of frequency. The relaxation peaks in tangent loss curves indicates the presences of polarons in the material and make this material applicable in medium frequency (MF) devices. The results of electrical resistivity measurements indicate the enhancement in room temperature resistivity with the substitution of Sm-Mn contents. The increase in resistivity reflects the applications of synthesized material in microwave devices and reducing the eddy current losses.