In-Situ Measurement of Junction Temperature and Light Intensity of Light Emitting Diodes With an Internal Sensor Unit

被引：9

作者：

Li, Jiaming ^{[1
]}

Zhou, Yugang ^{[1
]}

Qi, Yundong ^{[2
]}

Miao, Zhenlin ^{[2
]}

Wang, Yanming ^{[2
]}

Xiu, Xiangqian ^{[1
]}

Liu, Bin ^{[1
]}

Zhang, Rong ^{[1
]}

Zheng, Youdou ^{[1
]}

机构：

[1] Nanjing Univ, Sch Elect Sci & Engn, Jiangsu Prov Key Lab Adv Photon & Elect Mat, Nanjing 210093, Jiangsu, Peoples R China

[2] Xiangneng Hualei Optoelect Co Ltd, Chenzhou 423038, Peoples R China

来源：

IEEE ELECTRON DEVICE LETTERS | 2015年 / 36卷 / 10期

基金：

中国国家自然科学基金;

关键词：

Built-in sensor; junction temperature; light emitting diodes (LEDs); light output power; photocurrent; RELIABILITY; SYSTEMS;

D O I：

10.1109/LED.2015.2471801

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This study designed and tested an innovative light-emitting diode (LED) chip with a built-in sensor. Two electrically isolated units, the LED (for light emission) and the sensor (for monitoring junction temperature and light intensity), were integrated on a single chip. The sensor unit determines the junction temperature by measuring the forward voltage; the light output power of the LED unit can be precisely extrapolated with a polynomial function based on the photocurrent and junction temperature. This novel structure enables the in-situ real-time monitoring of the LED junction temperature and light output power, which allows a highly detailed and/or in-field LED reliability analysis and provides valuable feedback information for smart LED lighting systems.

引用

页码：1082 / 1084

页数：3

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