Accessibility analysis for star probes in automatic inspection of rotational parts

被引:3
|
作者
Rico, JC [1 ]
Valiño, G [1 ]
Mateos, S [1 ]
Cuesta, E [1 ]
Suárez, CM [1 ]
机构
[1] Univ Oviedo, Dept Mfg Engn, Gijon, Asturias, Spain
关键词
D O I
10.1080/00207540110118091
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This article describes a method of accessibility analysis based on the geometrical study of all possible interferences between the probe and the part to be inspected. The parts considered in the analysis are rotational parts and their recognition is automatically made from a feature-based design. The probe considered is a star type, defined by adjustable parameters that allow for the adaptation to different types and sizes. The system analyses the possible collision with the machine column, touch probe and probe stylus. Apart from determining the conditions of collision, the system also calculates any collision-free positions on each surface to be probed. These positions can be used to obtain inspection paths for communication to a CMM or to a global inspection planning system. The collision conditions calculated have been checked and validated using different rotational parts.
引用
收藏
页码:1493 / 1523
页数:31
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