PULSED-LASER ANNEALING EFFECT ON STRUCTURAL AND ELECTRICAL CHARACTERISTICS OF CdS LAYERS

被引：0

作者：

Shindov, Peter ^{[1
]}

Kakanakov, Rumen ^{[2
]}

Kaneva, Svetlana ^{[1
]}

Anastasova, Theodora ^{[1
]}

机构：

[1] Tech Univ Sofia, Plovdiv Branch, Plovdiv 4000, Bulgaria

[2] Inst Appl Phys, Plovdiv 4000, Bulgaria

来源：

JOURNAL OF ELECTRICAL ENGINEERING-ELEKTROTECHNICKY CASOPIS | 2009年 / 60卷 / 01期

关键词：

CdS; spray pyrolysis; laser annealing; CdO; SEM; XRD; XPS; SOLAR-CELLS; THIN-FILMS; CONTACTS;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The effect of pulsed-laser annealing on the parameters of CdS thin layers in the medium of oxygen was studied. The CdS thin layers were deposited by spray pyrolysis and surface treatment by nanosecond pulses of a XeCl-laser. The changes in the layers were characterized by SEM, XRD and XPS. The results showed that a change in the morphology of the surface occurred; a by-surface layer consisting of CdO with high transparency and conductivity is formed as a consequence of oxidation of CdS. These results are discussed in the context of window layers in solar cells.

引用

页码：53 / 55

页数：3

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