Measurement system of the Seebeck coefficient or of the electrical resistivity at high temperature

被引:23
|
作者
Rouleau, O. [1 ]
Alleno, E. [1 ]
机构
[1] CNRS UPEC, UMR7182, ICMPE CMTR, F-94320 Thiais, France
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2013年 / 84卷 / 10期
关键词
THERMOELECTRIC-MATERIALS; THERMOPOWER; METALS; PROBE;
D O I
10.1063/1.4823527
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A high temperature Seebeck coefficient or electrical resistivity apparatus has been designed and fabricated to measure sample with typical size similar to 10 x 1 x 1 mm(3). It can measure both transport properties from 300 K to 1000 K in argon atmosphere. The sample lies transversely on top of two metallic half-cylinders, which contain heating cartridges and allow temperature and thermal gradient control and reversal. The temperature gradient is measured by two type N thermocouples pressed against the upper surface of the sample. The key feature of this apparatus is the disk-shaped junction of each type N thermocouple which strongly improves the thermal contact with the sample. The Seebeck coefficient is obtained by averaging over two measured values with opposite thermal gradient directions (similar to +/- 2 K). For the resistivity measurements, the temperature is stabilized and the temperature gradient is actively reduced below 0.2 K to make negligible any spurious thermal voltage. Uncertainties of similar to 3% for the Seebeck coefficient and 1% for the resistivity were obtained on Ni samples. The Seebeck coefficient and resistivity have also been measured on a skutterudite sample as small as similar to 7 x 1.5 x 0.5 mm(3) with very good agreement with literature. (C) 2013 AIP Publishing LLC.
引用
收藏
页数:7
相关论文
共 50 条
  • [1] An instrument for the high temperature measurement of the Seebeck coefficient and electrical resistivity
    Gunes, Murat
    Parlak, Mehmet
    Ozenbas, Macit
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2014, 25 (05)
  • [2] In situ measurement of electrical resistivity and Seebeck coefficient simultaneously at high temperature and high pressure
    Yuan, Bao
    Tao, Qiang
    Zhao, Xueping
    Cao, Ke
    Cui, Tian
    Wang, Xin
    Zhu, Pinwen
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2014, 85 (01):
  • [3] High-Temperature Measurement of Seebeck Coefficient and Electrical Conductivity
    J. de Boor
    C. Stiewe
    P. Ziolkowski
    T. Dasgupta
    G. Karpinski
    E. Lenz
    F. Edler
    E. Mueller
    Journal of Electronic Materials, 2013, 42 : 1711 - 1718
  • [4] High-Temperature Measurement of Seebeck Coefficient and Electrical Conductivity
    de Boor, J.
    Stiewe, C.
    Ziolkowski, P.
    Dasgupta, T.
    Karpinski, G.
    Lenz, E.
    Edler, F.
    Mueller, E.
    JOURNAL OF ELECTRONIC MATERIALS, 2013, 42 (07) : 1711 - 1718
  • [5] An Automatic Apparatus for Simultaneous Measurement of Seebeck Coefficient and Electrical Resistivity
    Xiong, Ruifeng
    Masoumi, Saeed
    Pakdel, Amir
    ENERGIES, 2023, 16 (17)
  • [6] Apparatus for Seebeck coefficient and electrical resistivity measurements of bulk thermoelectric materials at high temperature
    Zhou, ZH
    Uher, C
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2005, 76 (02): : 023901 - 1
  • [7] A high temperature apparatus for measurement of the Seebeck coefficient
    Iwanaga, Shiho
    Toberer, Eric S.
    LaLonde, Aaron
    Snyder, G. Jeffrey
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2011, 82 (06):
  • [8] Electrical resistivity and seebeck coefficient of segmented thermoelements
    Sharp, J.
    Gilbert, P.
    Thompson, A.
    ICT'06: XXV INTERNATIONAL CONFERENCE ON THERMOELECTRICS, PROCEEDINGS, 2006, : 29 - +
  • [9] An experimental system for measurements of Seebeck coefficient and electrical resistivity in bulk thermoelectric materials at high temperatures
    Wang, Jue
    Zhao, Yu
    Liao, Hao-Hsiang
    Priya, Shashank
    Huxtable, Scott T.
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2019, 30 (07)
  • [10] AN APPARATUS FOR HIGH-TEMPERATURE MEASUREMENT OF THERMAL DIFFUSIVITY ELECTRICAL CONDUCTIVITY AND SEEBECK COEFFICIENT
    MEDDINS, HR
    PARROTT, JE
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1969, 2 (05) : 691 - &