Structured illumination microscopy using extraordinary transmission through sub-wavelength hole-arrays

被引：8
|
作者：
Docter, Margreet W. [1 ]
van den Berg, Peter M.
Alkemade, Paul F. A. [1 ]
Kutchoukov, Vladimir G.
Piciu, Oana M.
Bossche, Andre
Young, Ian T.
Garini, Yuval [2 ,3 ]
机构：
[1] Delft Univ Technol, Kavli Inst Nanosci, NL-2628 CJ Delft, Netherlands
[2] Bar Ilan Univ, Dept Phys, IL-52900 Ramat Gan, Israel
[3] Bar Ilan Univ, Inst Nanotechnol, IL-52900 Ramat Gan, Israel
来源：
JOURNAL OF NANOPHOTONICS | 2007年 / 1卷
关键词：
near field optics; extraordinary transmission; far field imaging; microscopy;
D O I：
10.1117/1.2794786
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
A new microscopy method for multi diffraction-limited spot illumination is based on extraordinary light transmission through a periodic metal grid (typical period of 600 nm) of sub-wavelength holes (150 nm). Multiple spots illuminate a fluorescently labeled sample and the emission is collected by far-field optics. Theoretical comparison with a confocal microscope reveals equivalent spot sizes and a scanning method with the advantage of multiple illumination spots. The system is used to measure the actual transmitted field with a fluorescent sample in far-field. The obtained results are consistent with the theoretical prediction and provide a proof of concept of the midfield microscope.
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收藏
页数：10
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