Grain boundary diffusion in C60 thin films

被引：2
|
作者：
Katz, EA
Tuladhar, SM
Faiman, D
Shames, AI
Shtutina, S
机构：
[1] Ben Gurion Univ Negev, Jacob Blaustein Inst Desert Res, Dept Solar Energy & Environm Phys, IL-84990 Sede Boqer, Israel
[2] Ben Gurion Univ Negev, Dept Phys, IL-84105 Beer Sheva, Israel
来源：
INTERFACE SCIENCE | 2001年 / 9卷 / 3-4期
关键词：
fullerenes; grain boundaries; thin films; diffusion;
D O I：
10.1023/A:1015179332734
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
This paper focuses on the effect of grain boundaries on the diffusion processes in polycrystalline C-60 thin films. Electrically induced diffusion of Au was investigated by in situ measurements of the film conductivity. Electron Paramagnetic Resonance (EPR) spectroscopy was used to study diffusion of oxygen. Increase in grain sizes in polycrystalline C-60 thin films was found to result in the acceleration of gold and oxygen diffusion. The results are interpreted assuming that these impurities diffuse in C-60 films dominantly along grain boundaries.
引用
收藏
页码：331 / 335
页数：5
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