Testable design and testing of high-speed superconductor microelectronics

被引：1

作者：

Kerkhoff, HG ^{[1
]}

Joseph, AA ^{[1
]}

Heuvelmans, S ^{[1
]}

机构：

[1] CADTES, MESA Plus Res Inst, Testable Design & Testing Microsyst Grp, NL-7500 AE Enschede, Netherlands

来源：

FIRST IEEE INTERNATION WORKSHOP ON ELECTRONIC DESIGN, TEST AND APPLICATIONS, PROCEEDINGS | 2002年

关键词：

D O I：

10.1109/DELTA.2002.994580

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

True software-defined radio cellular base stations require extremely fast data converters, which can currently not be implemented in semiconductor technology. Superconductor Niobium-based delta ADCs have shown to be able to perform this task. The problem of testing these devices is a severe task, as still verb, little is known about possible defects in this technology. This paper shows art approach for gaining information on these defects and it is illustrated how BIST cart be a solution of detecting these defects in ADCs tinder extreme conditions.

引用

页码：8 / 12

页数：5

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