Imaging three-dimensional polarization in epitaxial polydomain ferroelectric thin films

被引：125

作者：

Ganpule, CS

Nagarajan, V

Hill, BK

Roytburd, AL

Williams, ED

Ramesh, R ^{[1
]}

Alpay, SP

Roelofs, A

Waser, R

Eng, LM

机构：

[1] Univ Maryland, Mat Sci Res & Engn Ctr, College Pk, MD 20742 USA

[2] Univ Connecticut, Dept Met & Mat Engn, Storrs, CT 06269 USA

[3] Rhein Westfal TH Aachen, Inst Werkstoffe Elektrotech, D-52056 Aachen, Germany

[4] Tech Univ Dresden, Inst Angew Photophys, D-01062 Dresden, Germany

来源：

JOURNAL OF APPLIED PHYSICS | 2002年 / 91卷 / 03期

关键词：

D O I：

10.1063/1.1421219

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Voltage-modulated scanning force microscopy (Piezoresponse microscopy) is applied to investigate the domain structure in epitaxial PbZr0.2Ti0.8O3 ferroelectric thin films grown on (001) SrTiO3. By monitoring the vertical and lateral differential signals from the photodetector of the atomic force microscope it is possible to separate out and observe the out-of-plane and in-plane polarization vectors in the thin film individually. The relative orientation of the polarization vectors across a 90degrees domain wall is observed. Nucleation of new reversed 180degrees domains at the 90degrees domain wall is studied and its impact on the rotation of polarization within the a domain is analyzed as a function of reversal time. (C) 2002 American Institute of Physics.

引用

页码：1477 / 1481

页数：5

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