Substrate orientation dependent fine structure splitting of symmetric In(Ga)As/GaAs quantum dots

被引:26
|
作者
Treu, J. [1 ]
Schneider, C.
Huggenberger, A.
Braun, T.
Reitzenstein, S.
Hoefling, S.
Kamp, M.
机构
[1] Univ Wurzburg, Inst Phys, D-97074 Wurzburg, Germany
关键词
ENTANGLED PHOTONS;
D O I
10.1063/1.4733664
中图分类号
O59 [应用物理学];
学科分类号
摘要
We present a comparative investigation of the fine structure splitting (FSS) from self-organized In(Ga)As quantum dots (QDs) grown on GaAs substrates with different lattice orientations. QDs grown on (111) B-and (112) oriented substrates are analyzed and compared to small QDs on commonly used (001) substrates. Mean values for the FSS as low as (5.6 +/- 0.6) mu eV are obtained for QDs on (111) B-GaAs, comparing favorably to the other two approaches ((11.8 +/- 1.7) mu eV for (112)-surfaces and (14.0 +/- 2.2) mu eV for (001)-surfaces). Single photon emission from (111) B QDs grown by droplet epitaxy is demonstrated via photon autocorrelation studies with a g((2))(0) value of 0.07. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4733664]
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页数:4
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