Pseudo No Reference image quality metric using perceptual data hiding

被引:43
|
作者
Ninassi, Alexandre [1 ]
Le Callet, Patrick [1 ]
Autrusseau, Florent [1 ]
机构
[1] Univ Nantes, Ecole Polytech, IRCCyN Lab, Rue Christian Pauc,La Chantrerie,BP 50609, F-44306 Nantes 3, France
来源
关键词
D O I
10.1117/12.650780
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Regarding the important constraints due to subjective quality assessment, objective image quality assessment has recently been extensively studied. Such metrics are usually of three kinds, they might be Full Reference (FR), Reduced Reference (RR) or No Reference (NR) metrics. We focus here on a new technique, which recently appeared in quality assessment context: data-hiding-based image quality metric. Regarding the amount of data to be transmitted for quality assessment purpose, watermarking based techniques are considered as pseudo no-reference metric: A little overhead due to the embedded watermark is added to the image. Unlike most existing techniques, the proposed embedding method exploits an advanced perceptual model in order to optimize both the data embedding and extraction. A perceptually weighted watermark is embedded into the host image, and an evaluation of this watermark allows to assess the host image's quality. In such context, the watermark robustness is crucial; it must be sufficiently robust to be detected after very strong distortions, but it must also be sufficiently fragile to be degraded along with the host image. In other words, the watermark distortion must be proportional to the image's distortion. Our work is compared to existing standard RR and NR metrics in terms of both the correlation with subjective assessment and of data overhead induced by the mark.
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页数:12
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