Piezo-resistive Ring-shaped AFM Sensors with Piconewton Force Resolution

被引:0
|
作者
Xiong, Z. [1 ]
Walter, B. [1 ]
Mairiaux, E. [1 ]
Faucher, M. [1 ]
Buchaillot, L. [1 ]
Legrand, B. [1 ]
机构
[1] IEMN, CNRS, UMR 8520, Inst Elect Microelect & Nanotechnol,Grp NAM6, Villeneuve Dascq, France
关键词
ring resonator; piezo-resistive detection; AFM;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A new concept of Atomic Force Microscope (AFM) oscillating probes using electrostatic excitation and piezo-resistive detection is presented. The probe is characterized by electrical methods in a vacuum chamber and by mechanical methods in air. The frequency-mixing measurement technique is developed to reduce the parasitic signal level. These probes resonant in the 1MHz range and the quality factor is measured about 53,000 in vacuum and 3,000 in air. The ring probe is mounted onto a commercial AFM set-up and the surface topography of PMMA sample (2 mu m square) is obtained. The force resolution deduced from the measurements is about 10 pN/Hz(0.5).
引用
收藏
页码:184 / 189
页数:6
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