共 50 条
- [3] An accurate simulation algorithm for focus variation microscopy [J]. SIXTH INTERNATIONAL CONFERENCE ON OPTICAL AND PHOTONIC ENGINEERING (ICOPEN 2018), 2018, 10827
- [4] Chromatic focus variation microscopy for surface metrology [J]. Optics Express, 2024, 32 (20) : 35527 - 35541
- [6] Lateral force calibration in atomic force microscopy: A new lateral force calibration method and general guidelines for optimization [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2006, 77 (05):
- [7] Electromagnetic modeling of interference, confocal, and focus variation microscopy [J]. ADVANCED PHOTONICS NEXUS, 2024, 3 (01):
- [10] Noncontact Method for Calibration of Lateral Forces in Scanning Force Microscopy [J]. LANGMUIR, 2011, 27 (08) : 4635 - 4644