A silicon nanocrystal tunnel field effect transistor

被引:6
|
作者
Harvey-Collard, Patrick [1 ,2 ,3 ]
Drouin, Dominique [2 ,3 ]
Pioro-Ladriere, Michel [1 ,4 ]
机构
[1] Univ Sherbrooke, Dept Phys, Sherbrooke, PQ J1K 2R1, Canada
[2] Univ Sherbrooke, Inst Interdisciplinaire Innovat Technol 3IT, Sherbrooke, PQ J1K 0A5, Canada
[3] Univ Sherbrooke, CNRS, UMI 3463, Lab Nanotechnol Nanosyst LN2, Sherbrooke, PQ J1K 0A5, Canada
[4] Canadian Inst Adv Res CIFAR, CIFAR Program Quantum Informat Sci, Toronto, ON M5G 1Z8, Canada
基金
加拿大自然科学与工程研究理事会;
关键词
SINGLE-ELECTRON TRANSISTOR; QUANTUM DOTS; DEVICES;
D O I
10.1063/1.4876765
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this work, we demonstrate a silicon nanocrystal Field Effect Transistor (ncFET). Its operation is similar to that of a Tunnelling Field Effect Transistor (TFET) with two barriers in series. The tunnelling barriers are fabricated in very thin silicon dioxide and the channel in intrinsic polycrystalline silicon. The absence of doping eliminates the problem of achieving sharp doping profiles at the junctions, which has proven a challenge for large-scale integration and, in principle, allows scaling down the atomic level. The demonstrated ncFET features a 10(4) on/off current ratio at room temperature, a low 30 pA/mu m leakage current at a 0.5 V bias, an on-state current on a par with typical all-Si TFETs and bipolar operation with high symmetry. Quantum dot transport spectroscopy is used to assess the band structure and energy levels of the silicon island. (C) 2014 AIP Publishing LLC.
引用
收藏
页数:4
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