Very high sensitivity extreme ultraviolet spectrometer for diffuse radiation

被引:29
|
作者
Bowyer, S [1 ]
Edelstein, J [1 ]
Lampton, M [1 ]
机构
[1] UNIV CALIF BERKELEY, CTR EUV ASTROPHYS, BERKELEY, CA 94720 USA
来源
ASTROPHYSICAL JOURNAL | 1997年 / 485卷 / 02期
关键词
dark matter; instrumentation; detectors; spectrographs; ultraviolet; ISM;
D O I
10.1086/304447
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
A compact instrument to measure the diffuse extreme ultraviolet background with unprecedented resolution and high sensitivity is described. The instrument can cover a bandpass from 350 to 1100 Angstrom, has similar to 5 Angstrom spectral resolution, and has simultaneous field imaging with similar to 5' resolution. Several new techniques were employed to achieve this performance, including the development of a unique, fast optical system optimized for diffuse spectroscopy, a novel low-noise microchannel plate photon detector, a mechanism that permits an accurate determination of all the expected backgrounds, and an electronic system with active baseline restoration and coordinate digitization that is free of differential nonlinearity. This instrument will provide a factor of 1000 increase in sensitivity over existing measurements with reasonable observing times.
引用
收藏
页码:523 / 532
页数:10
相关论文
共 50 条
  • [1] SPECTROMETER SYSTEM FOR DIFFUSE EXTREME ULTRAVIOLET-RADIATION
    LABOV, SE
    [J]. APPLIED OPTICS, 1989, 28 (23): : 5073 - 5079
  • [2] EPR SPECTROMETER OF VERY HIGH SENSITIVITY
    MISRA, H
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1958, 29 (07): : 590 - 594
  • [3] Absolute sensitivity calibration of an extreme ultraviolet spectrometer for tokamak measurements
    Guirlet, R.
    Schwob, J. L.
    Meyer, O.
    Vartanian, S.
    [J]. JOURNAL OF INSTRUMENTATION, 2017, 12
  • [4] An extreme ultraviolet spectrometer
    Didkovsky, LV
    Judge, DL
    Jones, AR
    [J]. Sensors and Camera Systems for Scientific and Industrial Applications VI, 2005, 5677 : 141 - 152
  • [5] Reanalysis of Voyager ultraviolet spectrometer limits to the extreme-ultraviolet and far-ultraviolet diffuse astronomical flux
    Edelstein, J
    Bowyer, S
    Lampton, M
    [J]. ASTROPHYSICAL JOURNAL, 2000, 539 (01): : 187 - 190
  • [6] EXTREME ULTRAVIOLET EXPLORER SPECTROMETER
    HETTRICK, MC
    BOWYER, S
    MALINA, RF
    MARTIN, C
    MROWKA, S
    [J]. APPLIED OPTICS, 1985, 24 (12): : 1737 - 1756
  • [7] Calibration of an extreme-ultraviolet transmission grating spectrometer with synchrotron radiation
    Seely, John F.
    Brown, Charles M.
    Holland, Glenn E.
    Hanser, Frederick
    Wise, John
    Weaver, James L.
    Korde, Raj
    Viereck, Rodney A.
    Grubb, Richard
    Judge, Darrell L.
    [J]. 1623, Optical Society of America (OSA) (40):
  • [8] Mass spectrometer characterization of reactions in photoresists exposed to extreme ultraviolet radiation
    Mbanaso, Chimaobi
    Kruger, Seth
    Higgins, Craig
    Khopkar, Yashdeep
    Antohe, Alin
    Cardineau, Brian
    Denbeaux, Gregory
    [J]. EXTREME ULTRAVIOLET (EUV) LITHOGRAPHY II, 2011, 7969
  • [9] Calibration of an extreme-ultraviolet transmission grating spectrometer with synchrotron radiation
    Seely, JF
    Brown, CM
    Holland, GE
    Hanser, F
    Wise, J
    Weaver, JL
    Korde, R
    Viereck, RA
    Grubb, R
    Judge, DL
    [J]. APPLIED OPTICS, 2001, 40 (10) : 1623 - 1630
  • [10] Sensitivity calibration of an imaging extreme ultraviolet spectrometer-detector system for determining the efficiency of broadband extreme ultraviolet sources
    Fuchs, S.
    Roedel, C.
    Krebs, M.
    Haedrich, S.
    Bierbach, J.
    Paz, A. E.
    Kuschel, S.
    Wuensche, M.
    Hilbert, V.
    Zastrau, U.
    Foerster, E.
    Limpert, J.
    Paulus, G. G.
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2013, 84 (02):